dc.creator | Vibbert, Daniel Scott | |
dc.date.accessioned | 2020-08-22T20:47:09Z | |
dc.date.available | 2018-08-27 | |
dc.date.issued | 2018-08-27 | |
dc.identifier.uri | https://etd.library.vanderbilt.edu/etd-08152018-130817 | |
dc.identifier.uri | http://hdl.handle.net/1803/13909 | |
dc.description.abstract | An enhancement to an existing radiation hardening by design (RHBD) technique is proposed. The technique, Sensitive Node Active Charge Cancellation (SNACC), protects sensitive A/MS circuit nodes against single-event transients by leveraging inherent charge sharing effects to provide cancellation of deposited charge. By analyzing the charge sharing effects that drive the SNACC technique, a new technique, Enhanced SNACC (ESNACC), is derived that affords the same protection of sensitive nodes but with less sensitive area penalty. Single-event transient simulation results of a bias circuit hardened with ESNACC are presented to demonstrate the ESNACC concept. | |
dc.format.mimetype | application/pdf | |
dc.subject | single-event hardening | |
dc.subject | single-event transients | |
dc.subject | single-event effects | |
dc.subject | radiation hardening by design | |
dc.title | An Enhanced Single-Event Charge Cancellation Technique for Sensitive Circuit Nodes | |
dc.type | thesis | |
dc.contributor.committeeMember | William Timothy Holman, Ph. D. | |
dc.contributor.committeeMember | Jeffrey Scott Kauppila | |
dc.type.material | text | |
thesis.degree.name | MS | |
thesis.degree.level | thesis | |
thesis.degree.discipline | Electrical Engineering | |
thesis.degree.grantor | Vanderbilt University | |
local.embargo.terms | 2018-08-27 | |
local.embargo.lift | 2018-08-27 | |