On-chip characterization of single-event charge-collection

Abstract

Particle strikes on microelectronic circuits lead to undesirable current transients on the circuit node due to charge generation and charge collection processes. Typically, TCAD tools are used to examine charge collection process after particle strikes and provide an insight into the various charge collection mechanisms. Since the charge collected on a circuit node is also affected by its circuit and layout parameters, and the presence of multiple transistors within a certain distance, on-chip characterization of charge collection becomes desirable for advanced technologies. The focus of this thesis is on the design of an on-chip self-triggered charge collection measurement circuit technique to experimentally quantify single-event charge collection process for deep sub-micron technologies. Simulation results on UMC 40nm technology show a maximum measurement resolution of ~5 fC for the circuit.