dc.creator | Poe, Grant Douglas | |
dc.date.accessioned | 2020-08-22T17:36:51Z | |
dc.date.available | 2019-07-22 | |
dc.date.issued | 2019-07-22 | |
dc.identifier.uri | https://etd.library.vanderbilt.edu/etd-07182019-231235 | |
dc.identifier.uri | http://hdl.handle.net/1803/13230 | |
dc.description.abstract | A radiation-hardened by design (RHBD) D flip-flop is presented that demonstrates a tolerance to radiation induced single-event upsets while maintaining desirable electrical performance characteristics over a wide range of supply voltages. The flip-flop is based on the unhardened Static Single-phased Contention Free Flip-Flop and maintains three characteristics of being static, single-phased, and contention free for robustness against Process/Voltage/Temperature variations in low voltage operation. The radiation robustness and electrical performance of the new RHBD D flip-flop design is then compared to the unhardened S2CFF, and a fully hardened DICE flip-flop design. These results demonstrate that this new flip-flop design has significant performance advantages over the DICE flip-flop and is much more hardened to radiation when compared to conventional flip-flop designs. | |
dc.format.mimetype | application/pdf | |
dc.subject | D Flip-Flop | |
dc.subject | Single-Event Upset | |
dc.subject | Radiation Hardened By Design | |
dc.title | A RADIATION-TOLERANT D FLIP-FLOP DESIGNED FOR LOW-VOLTAGE APPLICATIONS | |
dc.type | thesis | |
dc.contributor.committeeMember | Jeffrey S. Kauppila | |
dc.contributor.committeeMember | Lloyd W. Massengill | |
dc.type.material | text | |
thesis.degree.name | MS | |
thesis.degree.level | thesis | |
thesis.degree.discipline | Electrical Engineering | |
thesis.degree.grantor | Vanderbilt University | |
local.embargo.terms | 2019-07-22 | |
local.embargo.lift | 2019-07-22 | |