Browsing Electronic Theses and Dissertations by Author "Narasimham, Balaji"
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Narasimham, Balaji (2008-12-06)Department: Electrical EngineeringRadiation-induced soft errors have become a key reliability issue for advanced semiconductor integrated circuits. With technology scaling, a large fraction of the observed soft failures are estimated to be related to latched ...
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Narasimham, Balaji (2005-12-13)Department: Electrical EngineeringIt is now well known to the radiation effects community that single event effects caused by energetic particles, particularly single event transients, will be among the dominant reliability issues in advanced integrated ...