Browsing by Author "Bhuva, Bharat"

Now showing items 1-2 of 2

    • High-Current State Triggered in the Bulk FinFET Technology 
      Xu, Lyuan; 0000-0002-9791-0806 (2020-08-18)
      Department: Electrical Engineering
      The reliability of the digital integrated circuits has been one of the most important topics, and multiple studies have been carried out to increase the reliability of digital integrated circuits. High-current state triggered ...
    • SE Response of Guard-Gate FF in 16-nm and 7-nm Bulk FinFET Technologies 
      Cao, Jingchen; 0000-0002-9250-8594 (2020-09-14)
      Department: Electrical Engineering
      With scaling of CMOS technology, single event effect (SEE) has become more and more significant due to the increasing packing density and the reducing supply voltage and node capacitance. Therefore, radiation hardened by ...