dc.contributor.advisor | Kauppila, Jeffrey S. | |
dc.contributor.advisor | Bhuva, Bharat L. | |
dc.creator | D'Amico IV, Joseph Vincent | |
dc.date.accessioned | 2021-06-09T02:45:50Z | |
dc.date.created | 2021-05 | |
dc.date.issued | 2021-05-14 | |
dc.date.submitted | May 2021 | |
dc.identifier.uri | http://hdl.handle.net/1803/16597 | |
dc.description.abstract | In this work, single-event upset responses of D flip-flop designs with different threshold-voltage options in a 7-nm bulk FinFET technology are examined. Experimental data imply that single-event cross-section depends heavily upon supply voltage and particle linear energy transfer (LET) values. For close-to-nominal supply voltages and low-LET particles, the single-event upset response differs very little between threshold-voltage options; however, for low supply voltages and high-LET particles, experimental data indicates that flip-flops are more susceptible to single-event upsets at higher threshold voltages. These results are consistent with schematic-level simulations run to estimate the effect of threshold voltage on single-event transient (SET) pulse width and D flip-flop feedback-loop delay. Additional Technology Computer Aided Design (TCAD) simulations show that SET pulsewidths for worst-case strikes on an inverter are largely independent of threshold voltage. All these results together suggest that the weak dependence of single-event upset response on threshold voltage is due to the structure of FinFETs and the related charge-collection mechanisms. | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | |
dc.subject | Alpha particles | |
dc.subject | critical charge | |
dc.subject | cross sections | |
dc.subject | FinFETs | |
dc.subject | flip flops | |
dc.subject | heavy ions | |
dc.subject | single-event upset | |
dc.subject | radiation effects | |
dc.subject | supply voltage | |
dc.subject | threshold voltage | |
dc.title | Bias and Threshold-Voltage Dependencies of Single-Event Upsets in a 7-Nm Bulk FinFET Technology | |
dc.type | Thesis | |
dc.date.updated | 2021-06-09T02:45:50Z | |
dc.type.material | text | |
thesis.degree.name | MS | |
thesis.degree.level | Masters | |
thesis.degree.discipline | Electrical Engineering | |
thesis.degree.grantor | Vanderbilt University Graduate School | |
local.embargo.terms | 2021-11-01 | |
local.embargo.lift | 2021-11-01 | |
dc.creator.orcid | 0000-0002-7163-572X | |