dc.creator | Dodds, Nathaniel Anson | |
dc.date.accessioned | 2020-08-23T16:10:57Z | |
dc.date.available | 2009-12-10 | |
dc.date.issued | 2009-12-10 | |
dc.identifier.uri | https://etd.library.vanderbilt.edu/etd-12042009-113800 | |
dc.identifier.uri | http://hdl.handle.net/1803/15106 | |
dc.description.abstract | Direct charge collection measurements are presented which prove that the presence of tungsten near sensitive volumes leads to extreme charge collection events through nuclear reactions. We demonstrate that, for a fixed incident particle linear energy transfer (LET), increasing particle energy beyond a certain point causes a decrease in nuclear reaction-induced charge collection. This suggests that a worst-case energy exists for single-event effect susceptibility, which depends on the technology, device layout, and the incident ions’ fixed LET value. A Monte Carlo approach for identifying the worst-case energy is applied to certain bulk-Si and silicon-on-insulator technologies. Simulation results suggest that the decrease in charge collection beyond the worst-case energy occurs because the secondary particles produced from the high-energy nuclear reactions have less mass and higher energy and are therefore less ionizing than those produced by lower-energy reactions. | |
dc.format.mimetype | application/pdf | |
dc.subject | Monte Carlo | |
dc.subject | nuclear reactions | |
dc.subject | tungsten | |
dc.subject | MRED | |
dc.subject | single event effects | |
dc.subject | energy dependence | |
dc.title | Charge generation by secondary particles from nuclear reactions in back end of line materials | |
dc.type | thesis | |
dc.contributor.committeeMember | Robert Reed | |
dc.contributor.committeeMember | Marcus Mendenhall | |
dc.type.material | text | |
thesis.degree.name | MS | |
thesis.degree.level | thesis | |
thesis.degree.discipline | Electrical Engineering | |
thesis.degree.grantor | Vanderbilt University | |
local.embargo.terms | 2009-12-10 | |
local.embargo.lift | 2009-12-10 | |