Pulsed Laser Irradiation for Discrete Component Dose-Rate Model Development

Abstract

Pulsed-laser irradiation is used to simulate dose-rate effects in discrete devices. A methodology is established to correlate laser pulse energy results to an equivalent dose rate value without LINAC validation. It is demonstrated that laser dose rate data can be converted to equivalent LINAC data and that the percent coverage of metallization has a linear relationship with the conversion factor of device families. By using the percent metal coverage, the conversion factor of an untested part may be determined from the linear extrapolation of a trend established by similar device types. This conversion factor may be applied to laser data to establish dose rate or may be applied directly to the slope of the laser data to establish the correlating Kpp for insertion into dose-rate models. This process can be performed using a common laser and may be quickly applied to produce models for the fluctuating discrete parts lists for weapons system development.