Browsing by Author "Bhuva, Bharat L"

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    • The Analysis of Single Event Effects and Total Ionizing Dose 
      Feeley, Alex; 0000-0001-6288-1315 (2022-03-25)
      Department: Electrical Engineering
      Single event (SE) effects and total ionizing dose (TID) radiation for the 7-nm bulk FinFET technology node are investigated. SE cross-sections are investigated at near-threshold voltage (NTV) supply voltages for a variety ...