Browsing by Author "Atkinson, Nicholas Montgomery"

Now showing items 1-2 of 2

    • Single-Event Characterization of a 90-nm Bulk CMOS Digital Cell Library 
      Atkinson, Nicholas Montgomery (2010-04-12)
      Department: Electrical Engineering
      A single event occurs when an ionizing particle strikes a microelectronic circuit and deposits charge in the semiconductor material. Charge deposited by the particle is often collected by the circuit, resulting in a current ...
    • System-Level Radiation Hardening of Low-Voltage Analog/Mixed-Signal Circuits 
      Atkinson, Nicholas Montgomery (2013-09-12)
      Department: Electrical Engineering
      In a radiation environment analog circuits are particularly susceptible to radiation effects, due to stringent requirements on signal integrity and precision. This dissertation demonstrates system-level radiation-hardeni ...