Browsing by Subject "alpha"
Now showing items 1-2 of 2
-
(2008-12-06)Department: Electrical EngineeringRadiation-induced soft errors have become a key reliability issue for advanced semiconductor integrated circuits. With technology scaling, a large fraction of the observed soft failures are estimated to be related to latched ...
-
(2014-07-28)Department: Electrical EngineeringThe response of electronic devices to ionizing radiation is a reliability concern for commercial and space applications. An ionizing particle can cause charge to be generated and collected at the node of a circuit. If the ...