Browsing by Author "Xiong, Hao D."
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Xiong, Hao D. (2004-11-19)Department: Electrical EngineeringWe have studied 1/f noise and total-dose response associated with Al2O3/SiOxNy/Si(100) gate dielectrics. Both the radiation-induced threshold-voltage shifts and the low-frequency noise are significantly larger than are ...