Browsing by Author "Pagey, Manish Prabhakar"
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Pagey, Manish Prabhakar (2003-02-20)Department: Electrical EngineeringThe continuous demand for higher packing density and faster operating speeds in modern digital CMOS circuits has driven the scaling of the metal-oxide-silicon field effect transistors. The use of scaling schemes which do ...
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Pagey, Manish Prabhakar (2003-12-09)Department: Electrical EngineeringHot-carrier-induced degradation is a significant reliability concern in aggressively scaled metal-oxide-semiconductor~(MOS) transistors. The physical mechanisms responsible for hot-carrier degradation have been studied ...