Browsing by Author "Chatterjee, Indranil"
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Chatterjee, Indranil (2014-08-01)Department: Electrical EngineeringThe total ionizing dose induced degradation in advanced deep-submicron CMOS technologies has been significantly reduced by scaling. Damage to isolating field oxides remains a significant threat for integrated circuits ...
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Chatterjee, Indranil (2012-04-05)Department: Electrical EngineeringCMOS technologies can be either dual-well or triple-well. Triple-well technology has several advantages compared to dual-well technology in terms of electrical performance. Differences in the ion-induced single-event ...