Browsing by Author "Cao, Jingchen"

Now showing items 1-2 of 2

    • SE Response of Guard-Gate FF in 16-nm and 7-nm Bulk FinFET Technologies 
      Cao, Jingchen; 0000-0002-9250-8594 (2020-09-14)
      Department: Electrical Engineering
      With scaling of CMOS technology, single event effect (SEE) has become more and more significant due to the increasing packing density and the reducing supply voltage and node capacitance. Therefore, radiation hardened by ...
    • TOTAL-IONIZING-DOSE EFFECTS ON CHARGE-TRAPPING NAND MEMORY DEVICES 
      Cao, Jingchen; 0000-0002-9250-8594 (2022-05-16)
      Department: Electrical Engineering
      Total ionizing dose (TID) effects are important to consider for nonvolatile memories used in high-radiation environments. Nowadays NAND Flash memory devices are based primarily on 3D NAND architecture due to their advantages ...