Browsing by Author "Bennett, William Geoffrey"

Now showing items 1-2 of 2

    • Efficient characterization of transient pulse shapes from radiation induced upsets 
      Bennett, William Geoffrey (2012-07-18)
      Department: Electrical Engineering
      Single Events Upsets (SEU) have long been a concern of the space and aviation fields. An SEU occurs when the logic state of a data-storage element in an integrated circuit changes because of the charge generated by a ...
    • Single Event Upset Mechanisms in Emerging Memory Technologies 
      Bennett, William Geoffrey (2014-08-04)
      Department: Electrical Engineering
      The commercial memory industry, now more than ever, is looking at CMOS Flash alternatives to provide continued scaling of data storage elements. Meanwhile, radiation tolerant memory researchers and designers are investigating ...