Browsing by Author "Amusan, Oluwole Ayodele"
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Amusan, Oluwole Ayodele (2006-09-01)Department: Electrical EngineeringThe amount of charge required to represent a logic state in CMOS digital circuits has been reduced dramatically with the scaling of supply voltage and nodal capacitances, making radiation-induced single event effects ...
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Amusan, Oluwole Ayodele (2009-02-16)Department: Electrical EngineeringSub-100 nm technologies are more vulnerable than older technologies to single event effects (SEE) due to Moore's Law scaling trend. The increased SEE vulnerability has been attributed to the decrease in nodal charge for ...