Radiation Effects in Spacecraft Sensor Systems
| dc.contributor.advisor | Holman, William T | |
| dc.contributor.committeeChair | Holman, William T | |
| dc.creator | Hu, Michael D. | |
| dc.creator.orcid | 0000-0002-7795-7084 | |
| dc.date.accessioned | 2025-02-07T15:35:31Z | |
| dc.date.created | 2024-12 | |
| dc.date.issued | 2024-11-14 | |
| dc.date.submitted | December 2024 | |
| dc.description.abstract | Spacecraft, from star trackers to deep space probes, rely on sensor systems to provide a view into the physical world. Sensors are ever-increasing in complexity, with many modern integrated circuits (ICs) utilizing three-dimensional heterogeneous integration (3DHI) to create a “system of systems”. It is imperative to minimize sources of error within these systems of systems, especially when any errors within one system may affect subsequent or neighboring systems. Radiation effects may cause observed errors ranging from single-particle-induced single-event effects (SEEs) to cumulative multi-particle total ionizing dose (TID) effects. While parts of each system may not be rad hard, the sub-systems can be hardened to ensure that the “system of systems” is rad hard. | |
| dc.format.mimetype | application/pdf | |
| dc.identifier.uri | https://hdl.handle.net/1803/19499 | |
| dc.language.iso | en | |
| dc.subject | radiation effects, single event effects, total ionizing dose, imager, 3DHI | |
| dc.title | Radiation Effects in Spacecraft Sensor Systems | |
| dc.type | Thesis | |
| dc.type.material | text | |
| local.embargo.lift | 2025-12-01 | |
| local.embargo.terms | 2025-12-01 | |
| thesis.degree.discipline | Electrical and Computer Engineering | |
| thesis.degree.grantor | Vanderbilt University Graduate School | |
| thesis.degree.level | Doctoral | |
| thesis.degree.name | PhD |