Show simple item record

Layout-Based Fault Injection for Combinational Logic in Nanometer Technologies

dc.creatorKiddie, Bradley Thomas
dc.date.accessioned2020-08-22T00:02:42Z
dc.date.available2012-03-26
dc.date.issued2012-03-26
dc.identifier.urihttps://etd.library.vanderbilt.edu/etd-03262012-131128
dc.identifier.urihttp://hdl.handle.net/1803/11408
dc.description.abstractAs feature sizes and operating voltages decrease, single-event transients from particle strikes in logic circuits become more probable. Much literature is available on the effects of these events in memory, but with increasing clock speeds, combinational logic has also been shown to be at risk. In this work, several combinational circuits are selected and simulated, taking into account gate library and layout information, in order to characterize the effects of particle strikes which upset single nodes as well as multiple, physically adjacent nodes. It is shown that traditional reliability tests which simulate a single fault are not sufficient – multiple faults stemming from a single strike occur and are more complex. However, multiple faults do not always translate to additional errors in the output – logical reconvergence limits the effect of faults within a circuit. In order to properly understand reliability in circuit design, analysis of multiple faults should be taken into account.
dc.format.mimetypeapplication/pdf
dc.subjectreliability
dc.subjectradiation-induced faults
dc.subjectsingle-event transient
dc.subjectmultiple transient faults
dc.subjectsoft errors
dc.subjectcombinational logic
dc.subjectlayout
dc.titleLayout-Based Fault Injection for Combinational Logic in Nanometer Technologies
dc.typethesis
dc.contributor.committeeMemberBharat L. Bhuva
dc.type.materialtext
thesis.degree.nameMS
thesis.degree.levelthesis
thesis.degree.disciplineElectrical Engineering
thesis.degree.grantorVanderbilt University
local.embargo.terms2012-03-26
local.embargo.lift2012-03-26
dc.contributor.committeeChairWilliam H. Robinson


Files in this item

Icon

This item appears in the following Collection(s)

Show simple item record