Browsing by Author "T. Daniel Loveless"
Now showing items 1-2 of 2
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Gaspard, Nelson Joseph III (2017-03-17)Department: Electrical EngineeringAlpha, heavy-ion, neutron, and proton experimental results from 130-nm to 28-nm technology nodes are establish single-event upset cross section trends in soft and hardened flip-flop designs. Trends show that at any LET ...
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Blaine, Raymond Wesley (2014-04-29)Department: Electrical EngineeringModern systems-on-chip (SOCs) must incorporate high-performance analog and mixed-signal (A/MS) circuits with digital systems onto a single chip. This integration necessitates that these A/MS circuits be designed at advanced ...